Characterization of Metal by GEM Detector Using Ion Beam Facility at IOP

A Triple GEM prototype of area 10 × 10 cm2 is fabricated and characterized using Fe55 source at the Institute of Physics, Bhubaneswar, India. The same GEM detector is used to characterize different metals by using the ion beam facility at the Institute of Physics. Proton beam generated from a 3 MV Tandem Pelletron has been used to emit X-rays from different metal targets, which irradiate on GEM. X-ray yield of the metals is directly proportional to the proton beam current. The spectra obtained from the detector have been used to detect the sample based on their energy output. The spectrum is taken with a brass sample shows two peaks corresponding to two X-ray energies.