Performance of a new star-bar phantom designed for MTF calculations in x-ray imaging systems.
2020
PURPOSE A new phantom, designed and manufactured for MTF calculations is presented in this work. The phantom has a star-bar pattern and is manufactured in stainless steel. MTF determinations are carried out with the new phantom and with an edge phantom to compare their performance and to compare them with previous theoretical predictions. METHODS The phantoms are imaged in an x-ray imaging system using different beam qualities and different entrance air KERMA. Methods, previously developed for synthetic images and simulations, are adapted to real measurements, solving practical implementation issues. RESULTS In the case of the star-bar, in order to obtain optimal MTF determinations it is necessary to accurately determine the center of the pattern. Also, to avoid underestimates in MTF calculations, the length in pixels of each of the scanning circumferences must be an integer multiple of the number of cycles in the pattern. Both methods, star-bar and edge, give similar mean values of the MTF in all cases analyzed. Also, the dependence with frequency of the experimental MTF standard deviation (SD) agrees with the theoretical expressions presented in previous works. In this regard, the precision is better for the star-bar method than for the edge and differences in precision between both methods are higher for the lowest beam quality. CONCLUSIONS The star-bar phantom can be used for MTF determinations with the advantage of having an improved precision. However, precision is reduced when the radiation quality increases. This fact suggests that, for the highest beam qualities, materials with an attenuation coefficient greater than that of steel should be used to manufacture the phantom.
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