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RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
2015
Oshima Azusa
Weckx Pieter
Kaczer Ben
Matsumoto Takashi
Kobayash Kazutoshi
Onodera Hidetoshi
Keywords:
Oscillation
Electronic engineering
Mathematics
Theoretical computer science
Electrical engineering
Engineering physics
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