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Si2Sb2Te5 phase change material studied by an atomic force microscope nano-tip
Si2Sb2Te5 phase change material studied by an atomic force microscope nano-tip
2009
Yanbo Liu
Ting Zhang
Xiaoming Niu
Zhitang Song
minguoquan
Jing Zhang
Weimin Zhou
Yongzhong Wan
zhangjianping
Xiaoli Li
Keywords:
Non-contact atomic force microscopy
Atomic de Broglie microscope
Conductive atomic force microscopy
Atomic force acoustic microscopy
Materials science
Local oxidation nanolithography
Nanoindentation
Analytical chemistry
Magnetic force microscope
Kelvin probe force microscope
Optoelectronics
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