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RELAXATION PHENOMENA ASSOCIATED WITH RADIATION-INDUCED TRAPPED CHARGE IN Al$sub 2$O$sub 3$ MOS DEVICES.
RELAXATION PHENOMENA ASSOCIATED WITH RADIATION-INDUCED TRAPPED CHARGE IN Al$sub 2$O$sub 3$ MOS DEVICES.
1971
F. B. Micheletti
F. Kolondra
Keywords:
Electric charge
Radiation
Optoelectronics
Aluminium oxides
Materials science
radiation induced
relaxation phenomena
Correction
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