EVALUATION OF Pb 0·8 Sn 0·2 Te DETECTOR FABRICATION USING SURFACE ANALYSIS

In order to produce high performance Pb 0·8 Sn 0·2 Te detectors, the surface layer must be characterised and controlled during fabrication. Auger Electron Spectroscopy (AES) and Photoelectron Spectroscopy (ESCA) techniques are used to analyze the Pb 0·8 Sn 0·2 Te surface after being subjected to detector-processing steps. This paper presents AES and ESCA data for Pb 0·8 Sn 0·2 Te material after exposure to chemical etching, photoresist processing, and heat treatments. In addition, the Pb 0·8 Sn 0·2 Te surface is characterised after exposure to ambient room conditions and high humidity conditions. Once surfaces are characterised, a comparison can be made with the resulting detector parameters to determine the fabrication procedures which give the best detector performance and so that processes which produce stable detectors can be found.