Old Web
English
Sign In
Acemap
>
Paper
>
Hardness Test in Nanometer Region by Atomic Force Microscopy
Hardness Test in Nanometer Region by Atomic Force Microscopy
2004
Koji Miyake
Satoru Fujisawa
Atsushi Korenaga
Takao Ishida
Shinya Sasaki
Keywords:
Conductive atomic force microscopy
Nanometre
Vickers hardness test
Nanoindentation
Atomic force microscopy
Analytical chemistry
Kelvin probe force microscope
Materials science
Correction
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]