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Thickness and tensile stress determination of black silicon layers by spectral reflectance and Raman scattering
Thickness and tensile stress determination of black silicon layers by spectral reflectance and Raman scattering
2019
Martin Kralik
Stanislav Jurečka
Emil Pinčík
Keywords:
Reflectivity
Engineering
Stress (mechanics)
Electronic engineering
Raman scattering
Black silicon
Composite material
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