Mitigation technique for non-linear DC-shift induced by power supply noise in a 28 nm BGR reference

This paper presents a non-linear analysis of DC-shift induced by power supply noise in bandgap voltage references based on a diode connected PNP bipolar junction transistors (BJT) couple. The analysis is based on diode non-linear characteristic causing a variation of biasing currents involved in closed loop feedback. The observed effect is discussed, simulated, measured and compared with analytical derivation. A bandgap reference has been implemented in a CMOS 28 nm technology and used for successfully validating the proposed analysis.