Old Web
English
Sign In
Acemap
>
Paper
>
A highly stable noncontact SPM for surface profile measurement and its application to insulating samples
A highly stable noncontact SPM for surface profile measurement and its application to insulating samples
2016
Shigeaki Goto
Minglei Li
So Ito
Yuki Shimizu
Wei Gao
Keywords:
Scanning probe microscopy
Engineering
Atomic force microscopy
Kelvin probe force microscope
Tuning fork
Optics
Chemistry
Correction
Source
Cite
Save
Machine Reading By IdeaReader
10
References
2
Citations
NaN
KQI
[]