Data acquisition chip test system and device and control method therefor

A data acquisition chip test device (10) and a control method therefor. The test device (10) comprises: a data acquisition module (200) for receiving a plurality of frames of sampling data acquired by a data acquisition chip; a storage module (300); a processing module (400) for calculating noise of a plurality of data sampling points to obtain a noise test result; a data transceiving module (500) for uploading the noise test result; and a control module (600). The test device (10) calculates noise of a plurality of data sampling points so as to only need to upload a noise test result, so that the chip test efficiency is improved, the chip test cost is reduced, and the test reliability is better ensured.