Voltage noise and jitter analysis for swept source optical coherence tomography using KTa1−xNbxO3 deflector

Abstract This paper describes voltage noise and jitter analysis for the depth deviation of a point spread function in a swept source optical coherence tomography system using a KTa 1- x Nb x O 3 deflector. An interference waveform with voltage noise and jitter was simulated according to a previous report. Typical values for the voltage noise Δ V TYP and jitter Δ t TYP were also obtained from a previous report and experiment. It was determined that the depth deviation is limited by the Δ t TYP of the system. Therefore, the quality of the tomographic image can be efficiently improved by reducing jitter.