An eddy current hall effect in semiconductors

It is widely known that a time-varying magnetic field induces an eddy current in a conducting material. In a semiconductor, the eddy current and the field jointly generate a time-varying Hall voltage. First investigated more than 50 years ago, this Hall effect is yet to be accurately detected in a laboratory. One of the primary unresolved issues with its measurement is a noise voltage. The noise was not quantitatively investigated or addressed in any of the previously published reports. In this conference proceeding this noise voltage is discussed in details, and proper guidelines are provided so that both the noise and the signal can be individually measured without any bothering interferences. These high transient field Hall measurements can be carried out using home-built, low-cost magnets, and therefore can be set-up in any laboratory.