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Ultrafast photoinduced transient strain in BiFeO 3 thin film probed by x-ray free electron laser diffraction
Ultrafast photoinduced transient strain in BiFeO 3 thin film probed by x-ray free electron laser diffraction
2019
Hyeon-Jun Lee
Youngjun Ahn
Samuel Marks
Eric C. Landahl
Joonyoung Lee
tayeon kim
Sanjith Unithrattil
Ji Young Jo
Sehwan Cheon
Su-Nam Kim
Carolina Adamo
Darrell G. Schlom
Haidan Wen
Paul G. Evans
Keywords:
Ultrashort pulse
Thin film
X-ray
Free-electron laser
Diffraction
Optoelectronics
Strain (chemistry)
Materials science
transient strain
Correction
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