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Structure and Emission Evolution in Si-Rich HfO2:Pr Films Versus Annealing Temperature
Structure and Emission Evolution in Si-Rich HfO2:Pr Films Versus Annealing Temperature
2021
Leonardo Gabriel Vega Macotela
Tetyana Torchynska
José Oliveros-García
Larysa Khomenkova
Fabrice Gourbilleau
Keywords:
annealing
Crystallography
Materials science
Correction
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