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An on-wafer cryogenic microwave probing system for advanced transistor and superconductor applications
An on-wafer cryogenic microwave probing system for advanced transistor and superconductor applications
1993
J. Laskar
M. Feng
Keywords:
Heterojunction bipolar transistor
Engineering
Electrical engineering
Bipolar junction transistor
Transistor
Gallium arsenide
Electronic engineering
Wafer
Field-effect transistor
High-electron-mobility transistor
Indium phosphide
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