X-Ray Characterization and Domain Structure of High-Quality SrBi2Ta2O9 Single-Crystals Grown by Self-Flux Solution Method

High-quality SrBi2Ta2O9 single crystals were grown by self-flux solution method. According to x-ray topography the crystals with layered habitus and typical dimensions up to ∼ 7 × 5 × 0.05 mm3 show perfect (001)-orientation with the edges directed along [110] axes. The quality of the crystals was also confirmed by high-field measurements, which did not detect any ferroelectric hysteresis along the c-axis crystallographic direction thus confirming that the polarization vector lies entirely in the a-b plane. Sharp phase transition (Tc = 350°C) with well-defined Curie-Weiss behavior above the transition was found. Examination of the domain structure revealed well-faceted 90° domains forming due to mechanical twinning above the transition to ferroelectric phase.