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ゲート電圧印加時におけるへき開MIS-Si(111)表面の断面STM/STS測定
ゲート電圧印加時におけるへき開MIS-Si(111)表面の断面STM/STS測定
2015
isihara yuu ri
katou naoya
tatibana kazuya
hirota bou
hattori satosi
daimon hirosi
Wei Tingting
fuziwara kouhei
hattori azusa
tanaka syuuwa
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