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Invited: Interfacial Lithiation of Layered Heterostructures Measured by Real-Time X-ray Reflectivity
Invited: Interfacial Lithiation of Layered Heterostructures Measured by Real-Time X-ray Reflectivity
2014
Timothy T. Fister
Paul Fenter
Bing Shi
Jennifer Esbenshade
Andrew A. Gewirth
Xiao Chen
Guennady Evmenenko
Xianyi Hu
Michael Bezyk
Keywords:
Heterojunction
Materials science
X-ray reflectivity
Optics
Correction
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