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Deep Understanding of Retention Characteristics in Various Conditions in Sub 20-nm NAND Flash Memory
Deep Understanding of Retention Characteristics in Various Conditions in Sub 20-nm NAND Flash Memory
2017
Lee Kyunghwan
Kang Myounggon
Shin Hyungcheol
Keywords:
Materials science
NAND gate
Inorganic chemistry
Electronic engineering
Flash memory
Nanotechnology
nand flash memory
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