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Degradation of Gate-Recessed MOS-HEMTs and Conventional HEMTs under DC Electrical Stress
Degradation of Gate-Recessed MOS-HEMTs and Conventional HEMTs under DC Electrical Stress
2021
Yuan Yidong
Dongyan Zhao
Yanrong Cao
Yubo Wang
Jin Shao
Yanning Chen
Wen-long He
Du Jian
Min Wang
Yeling Peng
Hongtao Zhang
Zhen Fu
Chen Ren
Liu Fang
Longtao Zhang
Yang Zhao
Ling Lv
Yiqiang Zhao
Xue-Feng Zheng
Zhimei Zhou
Yong Wan
Xiaohua Ma
Keywords:
Degradation (geology)
Optoelectronics
Materials science
Correction
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