Application of probes with multiple outputs on probe-compensated EMC near-field measurements
2010
Near-field scanning has become a popular measurement technique in the field of electromagnetic compatibility. This paper presents the application of probe compensation techniques to near-field measurements using probes with multiple outputs. The technique, which is based on plane wave theory, enables the calculation of the electric and magnetic field components above a device under test. Results based on measurements are shown for the case of a short electric dipole probe with two outputs.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
8
References
11
Citations
NaN
KQI