New perspectives on NBTI in advanced technologies: modelling & characterization

This work presents new perspectives of the NBTI in advanced technology. Both modelling and characterization of NBTI are investigated for the maturation of the reliability management in advanced node technologies. A physical-based VT instability model is presented considering interface trapped charges, fixed charges and oxide trapped holes effects. Finally, we discuss on the lifetime concept in the case of recoverable NBTI-induced degradation.