XRF topography information: Simulations and data from a novel silicon drift detector system

Abstract This work presents the latest findings of an ongoing research project Bille et al. (2016)  [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system (Gianoncelli et al., 2016) deployed on the TwinMic beamline (Elettra Sincrotrone Trieste, Trieste, Italy) (Gianoncelli et al., 2016).