Resolving the Evolution of Atomic Layer-Deposited Thin-Film Growth by Continuous In Situ X-Ray Absorption Spectroscopy

2021 
In situ synchrotron X-ray absorption near-edge structure characterization of thin-film titania growth by atomic layer deposition (ALD) over ZnO nanowires reveals persistent low-coordinated Ti motif...
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    55
    References
    1
    Citations
    NaN
    KQI
    []