The use of azimuthal intensity variations in diffraction patterns for particle shape characterization

Forward light scattering is a well established technique for measuring particle size distributions. The light intensity fluctuations which can be observed in the diffraction plane of the instrument can be used to stabilize the inversion process. Particle shape information is also present in these fluctuations. It is shown that an azimuthal-type of detector can be used to extract this information from the statistical correlations of the detector signals