High Efficiency Planar Ge-on-Si Single-Photon Avalanche Diode Detectors

2019 
Planar Ge-on-Si single-photon avalanche diode detectors fabricated using CMOS-compatible processing demonstrate a 38% single photon detection efficiency at 125 K with 1310 nm wavelength illumination, exhibiting 310 ps jitter and 2×10−16 WHz-½ noise equivalent power. © 2019 The Author(s)
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    7
    References
    0
    Citations
    NaN
    KQI
    []