A novel approach for affine point pattern matching
2006
Affine point pattern matching (APPM) is an integral part of many pattern recognition problems. Given two sets P and Q of points with unknown assignments pi →qj between the points, no additional information is available. The following task must be solved:
– Find an affine transformation T such that the distance between P and the transformed set Q′= TQ is minimal.
In this paper, we present a new approach to the APPM problem based on matching in bipartite graphs. We have proved that the minimum of a cost function is an invariant under special affine transformations. We have developed a new algorithm based on this property. Finally, we have tested the performance of the algorithm on both synthetically generated point sets and point sets extracted from real images.
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