A simulation study for determination of refractive index dispersion of dielectric film from reflectance spectrum by using Paul wavelet

In this work, the Continuous Wavelet Transform (CWT) with Paul wavelet was improved as a tool for determination of refractive index dispersion of dielectric film by using the reflectance spectrum of the film. The reflectance spectrum was generated theoretically in the range of 0.8333 - 3.3333 μm wavenumber and it was analyzed with presented method. Obtained refractive index determined from various resolution of Paul wavelet were compared with the input values, and the importance of the tunable resolution with Paul wavelet was discussed briefly. The noise immunity and uncertainty of the method was also studied.