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Improvement in Bias Stress Reliability by Barrier Thickness Variation in GaN Based Light-Emitting Diodes
Improvement in Bias Stress Reliability by Barrier Thickness Variation in GaN Based Light-Emitting Diodes
2011
Bo Hyun Kong
Hyung Koun Cho
Sung-Hoon Jung
Jong-Pil Jeong
Seon Ho Lee
Sanghyun Lee
Sung-Jin Son
Myeong-Seok Oh
Keywords:
Analytical chemistry
Light-emitting diode
Chemistry
bias stress
Optoelectronics
Correction
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