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X-ray Atomic-Scale Analysis of Self-Assembled Monolayer Growth on Silicon
X-ray Atomic-Scale Analysis of Self-Assembled Monolayer Growth on Silicon
2008
Jui Ching Lin
Joshua A. Kellar
Jungki Kim
Nathan L. Yoder
Kirk H. Bevan
Supriyo Datta
SonBinh T. Nguyen
Mark C. Hersam
Michael J. Bedzyk
Keywords:
Molecular electronics
Single bond
Atomic units
Standing wave
X-ray reflectivity
X-ray fluorescence
Crystallography
Materials science
Optics
Silicon
Self-assembled monolayer
Nanotechnology
X-ray
Correction
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