Solution processed chalcogenide films and micro-patterns via self-assembly

Chalcogenide (ChG) are the choice materials for IR applications due to their high refractive index, mid IR transparency and high nonlinear optical properties. In this work, we study the characteristics of solution processed Chalcogenide films, As2S3 prepared by various amine solvents, for possible pattern fabrications. Since solution processed ChG films tend to contain solvent related defects, it is important to optimize the process parameters to create defect free films, structurally similar to bulk ChG. We have studied the physical integrity and morphology of solution processed ChG films as a function of annealing conditions and film thickness. Optical and morphological characterizations of these films are carried out in order to fabricate defect free, optically useful micro-structures.