Label Free Super-Resolved Nanoscopy: PALM-Like, STED-Like and Hybrid AFM/NSOM

In this presentation we will show three advanced techniques for label-free super-resolved nanoscopy. We will start by presenting a PALM-like concept in which localization precision is converted into spatial imaging resolution. The concept is based upon usage of metallic freely moving nano-particles interacting with the inspected sample. Their temporal-spatial properties of light scattering are used to construct the super-resolved image. This concept is a linear nanoscopy that does not use the non-linearity of fluorescence dye. Then, we will present a STED-like approach in which the non-linearity of plasma dispersion effect of silicon is used in order to generate a sub-wavelength point spread function and to scan with it the inspected silicon wafer. This approach is good for failure analysis of micro-electronic integrated chips or for biomedical imaging if instead of silicon wafers we use silicon freely moving nano-particles. The last concept involves construction of a hybrid atomic force and near field scanning microscope which has an AFM tip into which a photo-detector is integrated and used to perform sub-wavelength photonic sensing instead of the fiber like tip of the conventional NSOM device.