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Detection of Subsurface, Nanometer-Scale Crystallographic Defects by Nonlinear Light Scattering and Localization
Detection of Subsurface, Nanometer-Scale Crystallographic Defects by Nonlinear Light Scattering and Localization
2021
Farbod Shafiei
Tommaso Orzali
Alexey Vert
Mohammad-Ali Miri
Pui Yee Hung
Man Hoi Wong
Andrea Alù
Gennadi Bersuker
Michael C. Downer
Keywords:
Optoelectronics
Nonlinear system
Scanning probe microscopy
Light scattering
Nanometre
Materials science
scale
threading dislocations
Correction
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