An Incremental Automatic Test Pattern Generation Method for Multiple Stuck-at Faults.

This paper proposes an incremental ATPG method to deal with multiple stuck-at faults. In order to generate the test set for $\pmb{n}$ multiple faults, only the additional test patterns for the undetected faults by the existing test patterns for $n$ - 1 multiple faults are generated. Moreover, by introducing an efficient fault selection method, the size of the fault list to be dealt with is reduced drastically compared to the entire fault list of $\mathbf{n}$ multiple faults. Our experimental results on ISCAS 89 and IWLS 2005 benchmarks up to triple faults indicate that the proposed method can generate a compact test set to cover all the faults within an acceptable runtime.