A step scanning controller for the elimination of drift effects in SAXS measurements

The controller was designed to obtain small-angle X-ray scattering curves by step scanning. Several angular ranges, having different step intervals, can be chosen. The controller enables the scattering curve to be scanned by a multiple cycle technique to eliminate the effects of long period drift of the incident beam. The technique is applied to obtain the corrected scattering curves of glassy carbon with an X-ray beam of varying intensity.