Forensic investigation of counterfeit coins
1997
Counterfeit coins were investigated using X-ray fluorescence (XRF) for a quantitative analysis without any pretreatment and by a metallic microscope for observation of their microstructures. Copper, nickel, iron, zinc, manganese, chromium, cobalt and lead were detected by XRF. Cluster analysis was applied to classify the counterfeit coins using their major six elements (Cu, Ni, Fe, Zn, Mn and Cr). The analytical results showed that the eighty-nine counterfeit coins could be divided into three groups, which were dependent upon the content of iron, chromium and zinc. Many bent micro-structures were observed at the letter and figure position and at the edge using a metal microscope after chemical etching.
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