Lifetimes of low-lying levels in 18F

Abstract Mean lifetimes of levels in 18 F have been measured using the Doppler-shift attenuation method and the inverse reaction 3 He( 16 O, p) 18 F. Targets of 3 He implanted into Al, Nb, and Au foils were employed in the measurements. The Doppler-broadened lineshapes observed at 0° to the beam were analyzed to obtain the following lifetime values: 0.971 ± 0.030, 0.605 ± 0.029 and 0.435 ± 0.041 ps for the 1.70(1 + ), 2.52(2 + ) and 3.36(3 + )MeV members of the K π = 1 + rotational band, 5.12 ± 0.56, 0.403 ± 0.018 and 1.91 ± 0.17 ps for the 2.10(2 − ), 3.13(1 − ) and 3.79(3 − ) MeV members of the K π = 0 − bands, and 〈1.2, 2.7 +4.1 −2.7 and 20 ± 2 fs for the 3.06(2 + , T = 1), 3.72(1 + ) and 3.84(2 + ) MeV states, respectively.