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Optical and X-ray studies of MOCVD-grown InGaN epilayers with low indium concentration
Optical and X-ray studies of MOCVD-grown InGaN epilayers with low indium concentration
2001
Gil Han Park
Seon-Ju. Hwang
S K Shee
Tomoya Sugahara
J. B. Lam
Gordon Gainer
Jin Joo Song
Shiro Sakai
Keywords:
X-ray
Indium
Analytical chemistry
Materials science
Metalorganic vapour phase epitaxy
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