Hard X-ray Full Field Nano-imaging of Bone and Nanowires at SSRL

A hard X‐ray full field microscope from Xradia Inc. has been installed at SSRL on a 54‐pole wiggler end station at beam line 6‐2. It has been optimized to operate from 5–14 keV with resolution as high as 30 nm. High quality images are achieved using a vertical beam stabilizer and condenser scanner with high efficiency zone plates with 30 nm outermost zone width. The microscope has been used in Zernike phase contrast, available at 5.4 keV and 8 keV, as well as absorption contrast to image a variety of biological, environmental and materials samples. Calibration of the X‐ray attenuation with crystalline apatite enabled quantification of bone density of plate‐like and rod‐like regions of mouse bone trabecula. 3D tomography of individual lacuna revealed the surrounding cell canaliculi and processes. 3D tomography of chiral branched PbSe nanowires showed orthogonal branches around a central nanowire.