Method and equipment of detecting optical far field parameters of optical system

The detecting method is an optical fiber probe scanning process by setting the micropore tip of an optical fiber probe in the optical far field position of tested sample. The detecting equipment includes mainly a three-dimensional optical fiber scanner with an optical fiber probe in the central axis, an optoelectronic detector to receive the optical signal of the optical fiber probe, a phase-locked amplifier and a computer, and a high-voltage amplifier for the computer to control the scanning of the optical fiber probe. The present invention has the features of obtaining two-dimensional or three-dimensional real-time optical far field parameters of sample in high precision.