Intrinsic Losses in Dielectrics Investigated by Terahertz Spectroscopy

Low-loss dielectrics with various microstructure and, consequently, different extrinsic losses were investigated by using terahertz time-domain spectroscopy. The losses have been extrapolated and compared with those measured at microwave frequencies. The results showed that extrinsic factors have a considerably contribution in microwave domain. The intrinsic limit of dielectric loss of low absorption polycrystalline materials have been estimated by terahertz spectroscopy.