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Degradation mechanism of light-emitting diodes based on GaAs:Si
Degradation mechanism of light-emitting diodes based on GaAs:Si
1991
G. N. Semenova
Iu. A. Tkhorik
L. S. Khazan
V. I. Vdovin
Keywords:
Mean time between failures
Silicon
Optoelectronics
Light-emitting diode
Service life
Degradation (geology)
Electron microscope
Materials science
Correction
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