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Erratum to “Modeling Avalanche Induced Degradation for 4H-SiC Power MOSFETs”
Erratum to “Modeling Avalanche Induced Degradation for 4H-SiC Power MOSFETs”
2021
Jiaxing Wei
Siyang Liu
Xiaobing Zhang
Weifeng Sun
Alex Q. Huang
Keywords:
Power MOSFET
Degradation (geology)
Optoelectronics
Materials science
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