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Methodology to Determine Bulk Crystal Quality in Terms of Carrier Lifetime without Wafering
Methodology to Determine Bulk Crystal Quality in Terms of Carrier Lifetime without Wafering
2020
J. Heitmann
C. Reimann
C. Kranert
Matthias Trempa
R. Menzel
K. Dadzis
R. Otto
S. Seidel
A. Albrecht
B. Neubert
P Haussermann
T. Urban
M. Ehrl
A.I. Kropp
A. Weber
M. Müller
Keywords:
Materials science
bulk crystal
Wafering
Passivation
Carrier lifetime
Optoelectronics
quality
Correction
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