Effects of Thermal Annealing Duration on the Film Morphology of Methylamine Lead Triiodide (MAPbI3) Perovskite Thin Films in Ambient Air

In the present communication we have studied the effect of thermal annealing duration on morphology of methylamine lead triiodide (MAPbI(3)) perovskite (prepared using single step method) semiconductor that changes into lead iodide (PbI(2)). Furthermore, the effect of annealing duration on thin films is investigated and correlated with its potential photovoltaic application. Thin films characteristics study by X-ray diffraction and scanning electron microscopy results indicate MAPbI(3) degraded strongly by annealing duration. However, thin films (about 1.25 micron-thick) annealed at 80 degrees C for 10 min in ambient conditions cause minimum degradation with smooth and uniform surface morphology. It also shows a higher absorption coefficient with the band gap of degrees 1.5 eV rendering this perovskite suitable for practical applications.