3D and 4D Lokalisierungsmikroskopie- Lokalisierungsmikroskopie- and tracking procedures and systems

A 3D localization microscopy system and 4D Lokalisationsmikroskopie- or emitter tracking system is designed such that a phase difference between light to / from a part of the lens, and light is caused to / from another part of the lens, a point emitter image comprising two lobes is generated, an offset between the lobes is related to the relative position of emitter and lens of the imaging system, wherein, in 4D system a further characteristic of the image or light is associated to / from the lens with a different, localization independent properties of the emitter.