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Interfacial Width Measurements of Dielectric/P(NDI2OD-T2) Using Resonant Soft X-ray Reflectivity
Interfacial Width Measurements of Dielectric/P(NDI2OD-T2) Using Resonant Soft X-ray Reflectivity
2011
Hongping Yan
Ziran Gu
Eliot Gann
Brian A. Collins
Sufal Swaraj
Cheng Wang
Torben Schuettfort
Christopher R. McNeill
Harald Ade
Keywords:
Dielectric
Threshold voltage
Nuclear magnetic resonance
Optoelectronics
X-ray reflectivity
Materials science
soft x ray
Reflectivity
Correction
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