Critical currents in NbZr superconducting thin films

The fabrication by sputtering of Nb/sub 0.75/Zr/sub 0.25/ thin films that showed critical temperature as high as 10.5 K is described. Transport critical current measurements on Nb/sub 0.75/Zr/sub 0.25/ films whose geometries were photolithographically defined in the micrometer range are reported. The measurements were performed as a function both of the temperature and of the magnetic field up to 6 T. The temperature behavior is compared with the Kim-Anderson model, and the magnetic field behavior of the resulting pinning force is compared with existing models. >