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Variability and technology aware SRAM Product yield maximization
Variability and technology aware SRAM Product yield maximization
2011
Zuber
Miranda
Bardon
Cosemans
Roussel
Dobrovolny
Chiarella
Horiguchi
Mercha
Hoffmann
Verkest
Biesemans
Keywords:
Yield (chemistry)
Very-large-scale integration
Sensitivity (control systems)
Reliability engineering
Product (mathematics)
Static random-access memory
random access memory
Mathematics
Maximization
Correction
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